The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools in general in modern science and also in nanotechnology which allows the study of both morphology and composition of materials. Scanning electron microscope can scan the surface of a sample and produce an image from the beam-specimen interactions. Here we introduce different makes of SEM one by one with courtesy to the write up and picture from their respective web resources.
Jeol-6400F SEM
This is a high resolution field emission scanning electron microscope. The high brightness source with this field emission SEM allows considerable flexibility in the types of imaging techniques. The JEOL-6400 is a fully computer-controlled SEM. The extremely fine electron source of the field emission system enables the attainment of much higher resolution images than a conventional SEM. Useful magnifications in excess of 200,000 times are obtainable, which translate to a resolution of 1.5 nm at an accelerating voltage of 30 kV. The high brightness of this source also allows high resolution imaging and characterisation of beam sensitive materials (eg. fragile plastics and integrated circuits) at high magnifications in excess of 100,000 times at very low accelerating voltages (ie. 0.2 to 5 kV). Insulating samples may also be examined without a conventional conductive coating of gold or carbon. The sample stage can handle specimens up to 20 cm in diameter making it ideal for inspection of items such as compact discs and wafers. The Jeol-6400F SEM possesses extensive frame store and image enhancement hardware and allows image capture and bidirectional image transfer between frame store and computer and networking capabilities. Images can be saved to an industry standard TIFF file format for use in a variety of other programs for off-line image enhancement and manipulation. Jeol -5800LV SEM with EDS has resolution of 3.0nm in high vaccum mode and 4.5nm in the low vaccum mode. Voltage range is 0.3kv-30kv and can work under pressures of up to 200 milliTorr. The low vacuum mode allows imaging and analysis of samples that do not have to be dried and coated before hand. This is particularly useful for handling "wet" samples such as soil, sandstone, and clay. see for details and latest models http://www.jeol.com/