The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools in general in modern science and also in nanotechnology which allows the study of both morphology and composition of materials. Scanning electron microscope can scan the surface of a sample and produce an image from the beam-specimen interactions. Here we introduce different makes of SEM one by one with courtesy to the write up and picture from their respective web resources.

Hitachi S-5200 Nano SEM
Hitachi S-5200 Nano SEM is one of the highest resolution SEM available. The magnification range goes from 100 X to 2,000,000 X. It is capable of remote access using the Quartz PCI Image acquisition system with the PGT EDS systems installed. It is ideally suited for observation of non conductive materials such as ceramics, polymers, catalysts, biological materials and semiconductors. Guaranteed resolution at 1 kV is 1.7 nm and at 30 kV is 0.5 nm. Remote access is available using the Quartz PCI Image Server.
It has a PGT Spirit Software, which in addition to acquiring a spectrum has other features such as elemental mapping, line scan and spotlighting for EDS analysis. It also has the award-winning position-tagged spectrometry (PTS), a technique for tagging each X-ray photon with the measured energy and X-Y coordinates. By using the PTS, one can open files at a later time for further analyses such as extracting a line scan or extracting elemental mappings.
see for details http://www.unm.edu/~cmem/nano/facilities/fac/Sem-s5200.htm and