The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools in general of modern science and also in nanotechnology which allows the study of both morphology and composition of materials. Scanning electron microscope can scan the surface of a sample and produce an image from the beam-specimen interactions. Here we introduce different makes of SEM one by one with courtesy to the write up and picture from their respective web resources.

The Philips XL30 is a new-generation, fully computer-controlled SEM. This instrument is an excellent tool for both the experienced and first-time user. The fine electron source of the Lanthanum hexaboride single crystal system enables the attainment of much higher brightness source with a higher resolution images than a conventional tungsten filament SEM. Useful magnifications in excess of 200,000 times are obtainable, which translate to a resolution of 3.5 nm at an accelerating voltage of 30 kV. The XL30 is a conventional SEM with optimum performance for both imaging and micro-analysis of conductive and/or coated specimens. This makes the system ideal for research in many fields. The electron optical column with its conical final lens and fixed final lens aperture is optimized for high resolution imaging, X-ray microanalysis and low magnification performance. The fixed final lens aperture, column design and the computer controlled alignment guarantee alignment free selection of kV and spot size, even up to high beam currents. The integration of advanced electron optics and extensive system automation with a unique, high-level user shell has produced a precision instrument with exceptional levels of performance, flexibility and usability. In addition, an embedded EDX system can offer the user a total analytical capability within one single instrument. A mouse-driven instrument operating within MS-Windows NT environment, the XL30 is geared towards the future with direct communication networking, digital images for storage and remote printing. The Philips XL30 is thus a multi-function, multi-user Scanning Electron Microscope. Not only is it capable of giving Secondary Electron images to 3.5nm resolution, but with its LaB6 filament is able to provide high quality Back-Scattered Electron images as well. This microscope is also equipped with a quantitative Energy Dispersive Spectrometer capable of chemical analysis with a detectable element range from B-U. A qualitative X-ray Mapping facility is also available. A cathodoluminesence detector is also supplied for looking at optical properties of materials. An Electron Back-Scattered Diffraction Pattern (EBSD) Camera is available which is able to determine sample orientation together with a Mapping Facility is able to provide sample details such as sample normal, coincident lattice sites, grain boundary disorientation, sample normal, pole figures and diffraction pattern maps. The sample stage can handle specimens up to 25 mm in diameter making it ideal for inspection of items such as metallurgraphic samples. The XL30 SEM possesses modest frame store and image enhancement hardware and allows automated stage control, image capture, and image transfer between its computer and the LAN network. Images can be saved to an industry standard TIFF file format for use in a variety of other programs for off-line image enhancement and manipulation.