The emergence of the application of AFM to nanoparticle characterization has developed over the past 10 years and is the most widely used subset of SPM, which can be used in ambient conditions with minimum sample preparation. AFM is able to measure three-dimensional topography information from the angstrom level to the micron scale with unprecedented resolution. AFM is well suited to individual particle characterization. The standard set of measured parameters includes: volume, height, size, shape, aspect ratio and particle surface morphology. As a single-particle technique, physical parameters for each particle in an image can be recorded and the data set can be processed to generate a statistical distribution for an entire set of particles (i.e. ensemble-like information). It is an excellent technique for visualizing particles with sizes ranging from 1nm to 10 micron. Another advantage of the AFM is its simplicity of operation and that it requires minimal sample preparation. Additionally, the AFM can operate in air, liquid or vacuum. In comparison to traditional techniques for single particle analysis of sub micron particles, the AFM gives three dimensional profiles. Speeding up the process of obtaining data is critical for many reasons and in this respect AFM is more attractive given its ability of individual particle imaging. In general, the AFM particle characterization is both cost and time effective as well as easier to use than electron microscopy. The resolution of AFM is greater or comparable to that of SEM/TEM, and strong advantages of AFM for particle characterization include direct measurements of height, volume and 3D display. The Atomic Force Microscope (AFM ) is being used to solve processing and materials problems in a wide range of technologies affecting the electronics, telecommunications, biological, chemical, automotive, aerospace, and energy industries. The materials being investigated include thin and thick film coatings, ceramics, composites, glasses, synthetic and biological membranes, metals, polymers and semiconductors. The AFM is being applied to study phenomena such as abrasion, adhesion, cleaning, corrosion, etching, friction, lubrication, plating and polishing. By using AFM one can not only image the surface in atomic resolution but also measure the force at nano-newton scale. Today the Atomic Force Microscopes (AFM) are the most commonly used scanning probe technique for materials characterization. Major advantages of AFM are that it has a combination of high resolution in three dimensions, the sample does not have to be conductive, and there is no requirement for operation within a vacuum.