Using the AFM, individual particles and groups of particles can be resolved. Microscope images are essential in research and development projects and can be critical when trouble shooting quality control issues. The AFM offers visualization in three dimensions. Resolution in the vertical, or Z, axis is limited by the vibration environment of the instrument: whereas resolution in the horizontal, or X-Y, axis is limited by the diameter of tip utilized for scanning. Typically, AFM instruments have vertical resolutions of less than 0.1 nm and X-Y resolutions of around one nm. In material sensing mode, the AFM can distinguish between different materials, providing spatial distribution information on composite materials with otherwise uninformative topographies. In Figure 3, material inhomogeneity can be seen on a topographically flat organic film. Similarly, nanocomposites can be analyzed for dispersion of particulate matter.